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  Wireless Hardness Tester NOVOTEST Lab UCI Pro

  NOVOTEST Lab UCI Pro is a next-generation portable hardness tester built on an advanced Ultrasonic Contact Impedance (UCI) technology. The device delivers a new level of measurement accuracy, stability, and usability, setting a higher standard for UCI hardness testing in both laboratory and field applications.

  The new technology and probe design significantly minimize operator influence and ensure highly repeatable results, even when testing complex-shaped components, thin parts, and surface-hardened layers.

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  Combined Hardness Tester NOVOTEST T-UD3

  Combined hardness tester combines two methods of measuring hardness: Ultrasonic Contact Impedance (ASTM A1038) and Leeb (ASTM A956). This makes the device the most versatile portable device as it can be.

   

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  UCI Hardness Tester NOVOTEST T-U2

  This is the most affordable UCI hardness tester, ideal for small, thin-walled, or complex-shaped products, unlike Leeb method models. With over 10 years of proven reliability, it offers the best price-quality ratio in the global market.

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  Ultrasonic Thickness Gauge NOVOTEST UT-1M

  Ultrasonic Thickness Gauge NOVOTEST UT-1M is used for operational non-destructive testing of the thickness of products with one-way access, at the moment this method is the most common in the world for solving such tasks.

   

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  EMAT Thickness Gauge NOVOTEST UT-3M-EMA

  The EMAT thickness gauge uses advanced electromagnetic-acoustic technology to measure metal thickness, even in cases where traditional methods like piezo-ultrasonic or laser-optical are not applicable. The technology allows measuring the thickness of products using ultrasound without couplant, through a coating or air gap.

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  Coating Thickness Gauge NOVOTEST TP-2020

  Updated and improved coating thickness gauge is designed for thickness measuring of coatings based on ferrous and non-ferrous metals. Variety of various probes make it possible of non-destructive testing of protective coatings with a wide thicknesses range.

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